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Ellipsometry

Ellipsometry is a non-destructive optical technique used to characterize the properties of surfaces and thin films. It is based on measuring changes in the polarization state of light when it is reflected from a surface.

To extract information about a sample's properties, the measured data is compared with theoretical models. These models consider the refractive indices, extinction coefficients of materials, and the thickness of thin films.

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    Experiment: Polarization by Reflection and Ellipsometry
    Sku 205030

    Experiment: Polarization by Reflection and Ellipsometry

    €3,128.33 €3,754.00
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    Experiment Measurement of indices and thickness by Ellipsometry
    Sku 202789

    Experiment Measurement of indices and thickness by Ellipsometry

    €2,750.00 €3,300.00
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