XR 4.0 crystallographic analysis extension kit

Sku: 608147
Phywee
The strong points
  • Material analyses using different techniques: diffractometric and photographic analyses. Samples of different structures: single crystal and polycrystalline samples, powder crystallites.

€4,270.00 €5,124.00
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On order

Leveling kit as an extension of the X-ray expert game XRE 4.0 (09110-88). This set is particularly suitable for the structural analysis of different types of samples in materials physics, chemical analysis, and mineralogy. The set covers the following experiments and topics: Fluoroscopy and X-ray imaging Debye-Scherrer analyses and images Laue diffraction patterns Fundamental principles of X-ray spectroscopy Bragg reflection, Bragg-Brentano geometry Brems spectrum Determination of Planck's action quantum X-ray diffractometry Texture analysis of growing materials X-ray monochromatization Analysis of crystals with different crystal structures: cubic, hexagonal, tetragonal, diamond, BCC, and FCC

The set covers the following experiments and topics:

Fluoroscopy and X-ray imaging
Debye-Scherrer analyses and images
Laue diffraction patterns
Fundamental principles of  X-ray spectroscopy
Bragg reflection, Bragg-Brentano geometry
Bremsspectrum
Determination of Planck's quantum of action
X-ray diffractometry
Texture analyses of grown materials
Monochromatisation of  X-rays
Analysis of crystals with different crystal structures: cubic, hexagonal, tetragonal, diamond, BCC, and FCC