Experiment: Polarization by Reflection and Ellipsometry

This lab has been revisited for educational purposes, moving 'step by step' towards the measurement of optical indices by ellipsometry. This technique, common in industry and research, is based on the principle of elliptically polarized light after reflection on a sample. Topics covered: - Malus' Law - Production of circular polarization - Analysis of some polarization ellipses - Polarization by reflection and Brewster's angle - Measurement of the indices (n,k) of bulk substrates by extinction ellipsometry Principles and objectives: The goniometric platform allows for high measurement precision (1 arc minute), necessary when one wishes to accurately verify the polarization properties of reflective materials and carry out precise measurements of the refractive index. The Brewster's angle is a particular angle of incidence for which the reflected light has special polarization properties that can be exploited, for example, to determine the refractive index of a material or the thickness of a transparent layer on a substrate.

Composition:
▪ 1 precision goniometric stage with 1 arc minute resolution and grid holder
▪ 2 swinging component holders
▪ 1 green laser 532nm - 1mW (ref.205157)
▪ 1 red laser diode 650nm - 1mW (ref.205151)
▪ 3 linear polarizers oriented in the horizontal plane on a graduated and rotatable mount (ref.204651)
▪ 2 quarter wave plates oriented in the horizontal plane on a graduated and rotatable mount (ref.204652)
▪ 1 set of 4 study samples (ref.205031)
▪ 1 laser power meter with remote probe on rod (ref.295969+204612)
▪ 1 illuminated magnifying glass (ref.204752)
▪ 1 index calculation utility
▪ 1 experimental guide